The criteria for the extended self-test are the same as the short self-test with two exceptions: segment The amount and location of the surface scanned are dependent on the completion time Particular methodology used in this test is also vendor specific.Ī read/verify scan segment wherein the drive performs read scanning of some portion of the disk Read/write circuitry test, and/or a test of the read/write head elements.Ī seek/servo segment wherein the drive tests it capability to find and servo on data tracks. The particular tests in this segmentĪre vendor specific, but as examples: this segment might include such tests as a buffer RAM test, a The details of the tests can be read in eg which summarises the elements of the short and long tests thus:Īn electrical segment wherein the drive tests its own electronics.
